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19.05.2014
New advances in sieve calibration
Dr Graham Rideal, CEO of UK-based calibration standards company Whitehouse Scientific, gave a presentation on the topic of ‘Calibrating test sieve apertures’ at the 7th World Congress for Particle Technology (WCPT 7) which took place this week in Beijing, China. He described recent research associated with his company’s launch of a new optical method for sieve calibration that is based on its ShapeSizer image analyzer.
“We have been working on extending the application of our ShapeSizer system and it can now be used not only for particle size analysis, but also to calibrate test sieves in a NIST traceable manner,” said Dr Rideal. “Unlike traditional calibration methods, which measure wire spacing only in the X and Y direction, the new ShapeSizer method measures individual aperture sizes and reports maximum and minimum dimensions. It therefore makes possible the measurement of aperture shape as well as size, wire dimensions, wire count and open area.” For further details visit http://www.whitehousescientific.com/sieve-standards-12-c.asp
Whitehouse Scientific’s Graham Rideal
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